Custom Macros for Zemax OpticStudio

What is Zemax Programming Language?

Zemax Programming Language (ZPL) is a scripting language used to automate tasks, customize analyses, and extend the capabilities of the Zemax software beyond the graphical interface.

What is a Zemax OpticStudio macro?

ZPL allows users to interact with the Zemax software by writing macros to perform various operations and calculations. These scripts can control the behavior of optical components, modify system settings, run simulations, extract analysis results, and much more. ZPL is built around a set of commands that correspond to different operations and actions within the Zemax environment.

What we do:

One of our main areas of expertise is developing custom and standard software extensions and macros for Zemax OpticStudio. We offer a list of standard macros and can also create customized macros tailored to your specific needs.

Some typical examples of extensions / macros that we can develop for you include:

- All analysis types (i.e., MTF, depth of field, sensitivity, tolerance, stray light, PSF) at various real and imaginary evaluation planes, considering changes in surface properties (such as glass type, coating, aperture, coefficients, etc.) or system variables (wavelength, field, pupil positions, configurations, temperature, etc.) as defined by the user's incremental steps.

- Detailed analysis of optical aberrations (Seidel / Zernike)

- Image evaluation for positioning error, slope error, aspect ratio, offset errors, slope error, aspect ratio error, divergence, dipvergence, offset gradient, slope gradient, local distortion offset, and more.

- Sensitivity analysis of systems involving complex geometries for three-dimensional movement of elements, element groups, or subsystems.

- Tolerance analysis of systems involving complex geometries for three-dimensional movement of elements, element groups, or subsystems.

- Stray light analysis.

- Non-sequential user-defined source modelling.

- Sequential and non-sequential user-defined surface modeling.

- Conditionally modifying surface properties (i.e., glass type, aperture, radius of curvature, thickness, coating, coefficients, etc.) and merit function editor operands (type, variable, target, weight, etc.) during optimization process.

- Backreflection analysis.

- Sunlight concentration analysis.

- Calculating distances, angles, and other geometrical variables between any surfaces (or surface points) in systems with complex geometries together with three-dimensional movement of elements, element groups, or subsystems.

- Collimation map.

- Retardance map.

- Reverse ray tracing.